Al-doped ZnO (ZAO) Films Prepared by Middle-frequency Alternative Magnetron Sputtering

刘江,庄大明,张弓,李春雷,段宇波
DOI: https://doi.org/10.3969/j.issn.1007-9289.2010.01.003
2010-01-01
China surface engineering
Abstract:Al-doped ZnO (ZAO) films have been prepared by two middle-frequency alternative magnetron sputtering power apparatus at various substrate temperatures with sputtering two ZAO ceramic targets in this paper.The influences of substrate temperature under different sputtering power apparatus and targets on microstructure,optical and electrical performances of ZAO films were investigated.The results show that substrate temperature is a dominant factor for microstructure and electrical performances of ZAO thin films.ZAO films have a hexagonal wurtzite structure with its preferred orientation along the c-axis perpendicular to the substrate surface.The film prepared at the substrate temperature of 240 ℃ exhibited a lowest resistivity of 1.4×10-3Ω·cm and average transmittance of over 82 % in visible range.
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