New Method of Laser Induced Wet-Chemical Etching

LIU Lin,YE Yu-tang,ZHAO Su-ying,LIU Juan-xiu,FAN Chao,WU Yun-feng,WANG Yu-lin
DOI: https://doi.org/10.3969/j.issn.1003-501x.2005.10.023
2005-01-01
Abstract:A new method — laser-assisted wet mask-etching is proposed.This method can control the etching area with resistant film masking.Both theoretical analysis and experimental results show that the image shape formed by laser chemical etching can be effectively controlled by resistant film masking and highly steep side walls can be obtained in deep etched holes because the laser propagates normally to the surface of semiconductor substrates without spreading and nearly homogeneous power density in the center of laser beam,thus the etching rate in the etching area is approximately the same,the etched area has no significant elevation difference.Since the resistant film masking method has the above-mentioned advantages,many faults of current laser etching method can be overcome and laser etching process can be simplified.This method has a broad application prospect in manufacturing special-structured opto-electronic devices and opto-electronic integration.
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