Structure and properties of Ti-Si-N nanocomposite films prepared by pulsed-DC plasma enhanced CVD

XP Niu,DY Ma,SL Ma,KW Xu
2005-01-01
Rare Metal Materials and Engineering
Abstract:Nanocomposite thin films composed of nano-crystalline TiN and nanosized amorphous Si3N4 were deposited on W(18)Cr4V substrate using an industrial set-up of pulsed-DC plasma enhanced chemical vapor deposition technique. The microstructure and the mechanical properties of Ti-Si-N films was explored. Results show that the crystallite size increas with the increasing of silicon content, and the micro-hardness of Ti-Si-N film increas at a range of silicon addition, the maximal hardness of films was 40.0 GPa. Furthermore, the micro hardness and crystallite size (measured at room temperature) remain stable up to high temperature of 800 degrees C.
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