Investigation on Measurement of Very Fast Transient Enclosure Voltage in Power Equipment

Pengcheng ZHAO,Yuanji CAI,Linxu LEI,Jiaxi HE,Weidong LIU
DOI: https://doi.org/10.13296/j.1001-1609.hva.2017.12.002
2017-01-01
Abstract:GIS may produce very fast transient enclosure voltage (TEV) in switching operation to cause electromagnetic compatibility problem in substation's secondary system.In this study,a test circuit and a measurement system for the very fast TEV were developed,and the influence of the wiring connection of the TEV point,the reference zero potential point and the measurement device on the TEV measurement accuracy was analyzed.A guiding principle and a recommended circuit for the TEV measurement were proposed.It is suggested that:connecting a large size conductor on GIS enclosure should be avoided in TEV measurement to avoid making change of the original TEV;voltage connecting wire should transmit reference zero potential instead of TEV to the measurement device to avoid causing distortion of TEV waveform.
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