a y ond ost Si 1 implantation : A pretreatment method for diamond nucleation on a Si wafer

Jie Yanga,Qijin Chen,Zhangda Linb
1996-01-01
Abstract:Diamond films have been obtained by the hot-filament chemical vapor deposition method on silicon wafer. The substrates were preimplanted by a Si 1 ion beam~ion energy 25 keV, implantation dosage 2 310 Si/cm). X-ray diffraction, scanning electron microscopy, and Raman spectroscop were used to characterize the structure of the synthesized films. The mechanisms for diam nucleation on a Si wafer have been discussed. Surface stress is believed to be one of the m important factors for low pressure diamond nucleation on the Si wafer. © 1995 American Institute of Physics.
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