Abstract:The rapid global expansion of electric vehicles and energy storage industries necessitates understanding lithium-ion battery performance under unconventional conditions, such as low temperature. This study investigates long-term capacity degradation of lithium-ion batteries after low temperature exposure subjected to various C-rate cycles. Findings reveal that low temperature exposure accelerates capacity degradation, especially with increased C-rates or longer exposure durations. A distinctive sunken region appears on the NMC H-stage peak as cycling progresses after low temperature exposure, indicating NMC particle damage and serving as a predictive signal for identifying low temperature exposure batteries. Electrochemical analyses and invasive detection indicate that low temperature exposure causes NMC particle cracking, leading to dead lithium generation. This dead lithium deposits on electrode surfaces, as well as the overconsumption of electrolyte, inhibiting reactions and reducing capacity. Additionally, dead lithium accumulates on separators, impeding ion transport and further accelerating capacity loss. NMC particle cracks develop faster after low temperature exposure due to stress concentration at internal slits. This stress concentration causes the maximum stress within the NMC particles to exceed tensile stress limits, resulting in rapid crack propagation. The internal cracks become larger with prolonged low temperature exposure, causing greater stress concentration and leading to faster crack propagation. Based on these insights, strategies from existing literature are discussed to mitigate the adverse impacts of low temperature exposure on lithium-ion battery performance and enhance the reliability and longevity of lithium-ion battery in extreme conditions.

Impact of low temperature on the TSG Vt shift during erase cycling of 3-D NAND Flash memory

Temperature Impacts on Endurance and Read Disturbs in Charge-Trap 3D NAND Flash Memories

Impact of Program–Erase Operation Intervals at Different Temperatures on 3D Charge-Trapping Triple-Level-Cell NAND Flash Memory Reliability

On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.

Electrothermal Simulation of Single-Walled Carbon Nanotube (Swcnt)-Based Phase Change Memory for 3-Dics

Impact of Low Temperature Exposure on Lithium-Ion Batteries: A Multi-Scale Study of Performance Degradation, Predictive Signals and Underlying Mechanisms

Impact Of Self-Heating Effect On The Retention Of 3-D Nand Flash Memory

The Influence of Thermally Assisted Tunneling on the Performance of Charge Trapping Memory

Decomposition of Charge Loss Mechanisms in 3-D Nand Flash Memory: Impact of Cell Dimension via High-Temperature Long-Term Retention Characteristics

Investigation of Endurance Characteristics in 3-D NAND Flash Memory With Trap Profile Analysis

Analysis and Optimization of Temporary Read Errors in 3D NAND Flash Memories

Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory

Analysis of electrostatic crosstalk in 3D vertical NAND Charge Trapping Memory with junctionless GAA nanowire FET

Simulation of Charge Trapping Memory with Novel Structures

Dependence Of Electrons Loss Behavior On The Nitride Thickness And Temperature For Charge Trap Flash Memory Applications

Impact of channel thickness on device scaling in vertical InGaZnO channel charge-trap memory transistors with ALD Al 2 O 3 tunneling layer

Electrothermal Investigation on Vertically Aligned Single-Walled Carbon Nanotube Contacted Phase-Change Memory Array for 3-D ICs

Investigation of the impact of grain boundary on threshold voltage of 3-D MLC NAND flash memory

Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design.

Analysis of Residual Stresses Induced in the Confined 3D NAND Flash Memory Structure for Process Optimization

Modeling the Thermal Characteristics of Stacked 2T0C Memory Array Based on InGaZnO4 Thin-Film Transistors