Abstract:Memory circuits have become important components in today's IC designs which demands extremely high integration density and reliability under process variations. The most challenging task is how to accurately estimate the extremely small failure probability of memory circuits where the circuit failure is a "rare event". Classic importance sampling has been widely recognized to be inaccurate and unreliable in high dimensions. To address this issue, we propose a fast statistical analysis to estimate the probability of rare events in high dimensions and prove that the estimation is always bounded. This methodology has been successfully applied to the failure analysis of memory circuits with hundreds of variables, which was considered to be very intractable before. To the best of our knowledge, this is the first work that successfully solves high dimensional "rare event" problems without using expensive Monte Carlo and classic importance sampling methods. Experiments on a 54-dimensional SRAM cell circuit show that the proposed approach achieves 1150x speedup over Monte Carlo without compromising any accuracy. It also outperforms the classification based method (e.g., Statistical Blockade) by 204x and existing importance sampling method (e.g., Spherical Sampling) by 5x. On another 117-dimension circuit, the proposed approach yields 364x speedup over Monte Carlo while existing importance sampling methods completely fail to provide reasonable accuracy.

An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis

Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation.

Importance Boundary Sampling for SRAM Yield Analysis with Multiple Failure Regions

High-Dimensional and Multiple-Failure-Region Importance Sampling for Sram Yield Analysis

MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS

Rapid Estimation of the Probability of SRAM Failure Via Adaptive Multi-Level Sliding-Window Statistical Method.

Efficient Importance Sampling for High-Sigma Yield Analysis with Adaptive Online Surrogate Modeling

An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

A Fast and Provably Bounded Failure Analysis of Memory Circuits in High Dimensions.

Efficient SRAM yield optimization with mixture surrogate modeling

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

An Efficient Optimization Based Method to Evaluate the DRV of SRAM Cells

Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage

Accurate Estimation of SRAM Dynamic Stability

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

Probabilistic Compute-in-Memory Design For Efficient Markov Chain Monte Carlo Sampling

Improving Importance Sampling Method in Structural Reliability

A systematic design methodology for yield-driven near-threshold SRAM design

Improved adaptive importance sampling algorithm

Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits