Advanced N-Channel LDMOS with Ultralow Specific On-Resistance by 0.18 Μm Epitaxial BCD Technology

Shanon Pu
DOI: https://doi.org/10.1109/cstic.2018.8369286
2018-01-01
Abstract:An advanced n-channel LDMOS (nLDMOS) by 0.18 μm epitaxial BCD Technology is proposed with the best-in-class performance. Thin drift region oxidation by independent LOCOS process is adopted and optimized to improve the trade-off between breakdown voltage (BV) and specific ON-resistance (R on, sp ). Both P-Body and N-Drift region vertical doping optimization is developed accordingly to improve the reliability of the device. Both 20 V and 30 V nLDMOS devices are designed, and experimental results show that ultralow R on, sp has been demonstrated (i.e., R on, sp = 6.5 mΩ-mm 2 for BV = 27.6 V, R on, sp = 9.6 mΩ mm 2 for BV = 37.3 V, respectively). Moreover, the electrical safe operating area (SOA) and hot-carrier injection (HCI) are also improved.
What problem does this paper attempt to address?