Ohmic Contacts Technology in Long-wavelength VCSEL Structure

Cheng LIU,Chun-fang CAO,Yan-feng LAO,Meng CAO,Hui-zhen WU
DOI: https://doi.org/10.3969/j.issn.1001-5868.2007.05.017
2007-01-01
Abstract:The important application of Ohmic contacts technology in long-wavelength vertical-cavity surface-emitting laser (VCSEL) is introduced. Circular transmission line model (CTLM) is used to measure the contact characterization between p-InGaAsP/InP and Ti-Au. It is found that Ohmic contact is formed between p-InGaAsP and Ti-Au after high-temperature rapid thermal annealing, and the lowest specific contact resistance can reach 6.49 × 10 -5 Ω·cm 2. The threshold voltage and series resistance of the 1.3 μm VCSEL structure which adopted the optimized ohmic contacts technology are reduced significantly.
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