Raman Stress Measurement of Crystalline Silicon Desensitizes Shear Stress: Only on {001} Crystal Plane

Lulu Ma,Huadan Xing,Qiu Li,Jianshan Wang,Wei Qiu
DOI: https://doi.org/10.7567/jjap.57.080307
IF: 1.5
2018-01-01
Japanese Journal of Applied Physics
Abstract:Silicon-based semiconductor materials, especially {001} silicon are the main functional materials in the electronic information industry. Residual stress plays an important role in the reliability of semiconductor devices. However, the stress state is often simplified, especially when the effect of shear stress on Raman wavenumber is neglected. In this study, the relationship between the Raman wavenumber and the plane stress components of typical crystal planes is established. It is observed that only the Raman wavenumber of the {001} plane has nothing to do with plane shear stress. Finally, a calibration experiment was carried out to validate the theoretical deduction. (C) 2018 The Japan Society of Applied Physics
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