Abstract:Texture and morphology evolution of modified Lanthanum Zirconium oxide (LaZr1.1Oy) films grown on biaxially textured Ni5%W tapes by chemical solution deposition (CSD) method at different heat-treatment conditions has been investigated. Results show that both the growth orientation and surface morphology of films are dependent on the heating rate and annealing temperature during heat-treatment process. Compared with the annealing temperature, heating rate shows a greater influence on the orientation growth of CSD-LaZr1.1Oy film. Slow heating rate is beneficial to a single (00l) orientation growth of LaZr1.1Oy grains on textured Ni-5at.%W (Ni5W) substrate. However, the surface morphology analysis reveals a minor effect of heating rate on the grain size and surface roughness of LaZr1.1Oy film. We consider that a slow heating rate would lead to the homogeneity nucleation of LaZr1.1Oy grains and eventually forming the great textured film due to the narrow temperature interval of the complete decomposition for LaZr1.1Oy precursor gel. In any case, high-quality LaZr1.1Oy film has been achieved at annealing temperature of 900 °C with heating rate of 2 °C/min. Moreover, we have grown epitaxial CeO2 film on the textured Ni5W substrate covered by LaZr1.1Oy film using CSD approach. CeO2 precursor solution was spin-coated on short sample of Ni5W/LZO and then heat-treated at 1000 °C for 30 min in Ar-4%H2. Detailed XRD and AFM studies indicate that CeO2 film has sharp bi-axial texture and smooth surface. These results demonstrate that a low-cost CSD LaZr1.1Oy film can act as a planarization template for the further production high Jc YBCO-superconducting film.

Highly (001)-oriented zirconium-doped ceria films grown on biaxially textured nickel tungsten substrates through an inorganic-salts-based chemical solution deposition route

Fabrication and Characterization of Y2O3 Stabilized ZrO2 Films Deposited with Aerosol-Assisted MOCVD

Effect of Sputtering-Target Composition on the Structure, Dielectric, Ferroelectric, and Energy Storage Properties of Highly (00L)-Oriented Ba(ZrxTi1–x)O3 Films

Preparation of Biaxially Textured Ce1-x(Y0.2Zr0.8)xOδ Buffer Layers on RABiTS NiW Tapes by Chemical Solution Deposition

Reel-To-Reel Continuous Deposition Of Ce(X)Zr(1-X)O(2) Single Buffer Layer For Ybco Coated Conductors

Epitaxial growth of CSD modified lanthanum zirconium oxide buffer layer for coated conductors

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Fabrication and Characterization of La2Zr2O7 Films on Different Buffer Architectures for YBa2Cu3O7−δ Coated Conductors by RF Magnetron Sputtering

A Compositional Gradient Ce1−xZrxO2 Buffer Architecture for Producing High-Performance YBCO Film

Single Cerium Zirconate Buffer Layer on Biaxially Textured Metal Substrates for High Performance Coated Conductors

Orientation Control and Dielectric Properties of Sol–gel Deposited Ba (ti, Zr)O3 Thin Films

Effects of buffer layers on the orientation and dielectric properties of Ba(Zr0.20Ti0.80)O3 thin films prepared by sol–gel method

Growth orientation and surface morphology of CeO2 films for high-Jc YBCO films on biaxially-textured Ni tape by PLD

Metal Organic Deposition of Lanthanum Zirconate Buffer Layer on Biaxially Textured Ni-5%W Substrate

Preparation and Texture Evolution of Epitaxially Grown CeO2 Buffer Layers Using Inorganic Salts As Starting Materials for YBCO Coated Conductors

Improved Textured La2Zr2O7 Buffer Layers on Bi-Axially Textured Ni–W Substrates Using CeO2 Seed Layers for YBa2Cu3O7−x Coated Conductors

Preparation of Thick Bazro3 Epitaxial Film for Coated Conductors by Polymer-Assisted Chemical Solution Deposition Method

Development Of Low-Fluorine Solution For Ybco Film Growth

MOCVD Preparation of YBCO Coated Conductors on CeO2/YSZ/Y2O3 Buffered RABiTS Substrate

Tailoring the Crystallographic Orientation of MOD-derived La2Zr2O7 Buffer Layers for Coated Conductors

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors