Abstract:Texture and morphology evolution of modified Lanthanum Zirconium oxide (LaZr1.1Oy) films grown on biaxially textured Ni5%W tapes by chemical solution deposition (CSD) method at different heat-treatment conditions has been investigated. Results show that both the growth orientation and surface morphology of films are dependent on the heating rate and annealing temperature during heat-treatment process. Compared with the annealing temperature, heating rate shows a greater influence on the orientation growth of CSD-LaZr1.1Oy film. Slow heating rate is beneficial to a single (00l) orientation growth of LaZr1.1Oy grains on textured Ni-5at.%W (Ni5W) substrate. However, the surface morphology analysis reveals a minor effect of heating rate on the grain size and surface roughness of LaZr1.1Oy film. We consider that a slow heating rate would lead to the homogeneity nucleation of LaZr1.1Oy grains and eventually forming the great textured film due to the narrow temperature interval of the complete decomposition for LaZr1.1Oy precursor gel. In any case, high-quality LaZr1.1Oy film has been achieved at annealing temperature of 900 °C with heating rate of 2 °C/min. Moreover, we have grown epitaxial CeO2 film on the textured Ni5W substrate covered by LaZr1.1Oy film using CSD approach. CeO2 precursor solution was spin-coated on short sample of Ni5W/LZO and then heat-treated at 1000 °C for 30 min in Ar-4%H2. Detailed XRD and AFM studies indicate that CeO2 film has sharp bi-axial texture and smooth surface. These results demonstrate that a low-cost CSD LaZr1.1Oy film can act as a planarization template for the further production high Jc YBCO-superconducting film.

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Preparation and Characterization of Ceo2/Ysz/Ceo2 Buffer Layers for Ybco Coated Conductors

A Novel Process for Ceo2 Single Buffer Layer on Biaxially Textured Metal Substrates in Ybco Coated Conductors

Preparation and Crystalline Qualities of SrTiO3 and CeO2 Buffer Layers Fabricated on Ni Substrates Via a Sol–gel Method for YBCO Coated Conductors

Single Cerium Zirconate Buffer Layer on Biaxially Textured Metal Substrates for High Performance Coated Conductors

Microstructure Analysis of High-Quality Buffer Layers on Textured Niw Tapes for Ybco Coated Conductors

Reel-To-Reel Continuous Deposition Of Ce(X)Zr(1-X)O(2) Single Buffer Layer For Ybco Coated Conductors

Fabrication of YBCO Coated Conductors on Biaxial Textured Metal Substrate by All-Sputtering

Texture and Morphology Developments of Yttria-stabilized Zirconia (YSZ) Buffer Layer for Coated Conductors by RF Sputtering

Fast Growth Processes of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

Deposition of high-textured buffer layers for YBCO coated conductors by all-IPAT-process

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors

Rapid Deposition of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

Biaxially Textured Ceo2 Seed Layers and Thin Films on Ni Substrates by Chemical Solution Deposition Using Inorganic Cerium Nitrate As A Precursor

Preparation of Biaxially Textured Ce1-x(Y0.2Zr0.8)xOδ Buffer Layers on RABiTS NiW Tapes by Chemical Solution Deposition

Highly (001)-oriented zirconium-doped ceria films grown on biaxially textured nickel tungsten substrates through an inorganic-salts-based chemical solution deposition route

Surface Morphology Evolution of CeO2/YSZ (001) Buffer Layers Fabricated Via Magnetron Sputtering

Improved Textured La2Zr2O7 Buffer Layers on Bi-Axially Textured Ni–W Substrates Using CeO2 Seed Layers for YBa2Cu3O7−x Coated Conductors

Preparation of Eu0.3Ce0.7O1.85-x single buffer layer on coated conductors by chemical solution deposition

Simultaneous double-sided deposition of long-length epitaxial CeO 2 buffer layers for YBCO coated conductors

Epitaxial growth of CSD modified lanthanum zirconium oxide buffer layer for coated conductors