Abstract:Ion beam-assisted deposition (IBAD) has been proposed as a promising texturing technology that uses the film epitaxy method to obtain biaxial texture on a non-textured metal or compound substrate. Magnesium oxide (MgO) is the most well explored texturing material. In order to obtain the optimal biaxial texture, the actual thickness of the IBAD-MgO film must be controlled within 12nm. Due to the bombardment of ion beams, IBAD-MgO has large lattice deformation, poor texture, and many defects in the films. In this work, the solution deposition planarization (SDP) method was used to deposit oxide amorphous Y2O3 films on the surface of Hastelloy C276 tapes instead of the electrochemical polishing, sputtering-Al2O3 and sputtering-Y2O3 in the commercialized buffer layer. An additional homogeneous epitaxy MgO (epi-MgO) layer, which was used to improve the biaxial texture in the IBAD-MgO layer, was deposited on the IBAD-MgO layer by electron-beam evaporation. The effects of growth temperature, film thickness, deposition rate, and oxygen pressure on the texture and morphology of the epi-MgO film were systematically studied. The best full width at half maximum (FWHM) values were 2.2° for the out-of-plane texture and 4.8° for the in-plane texture for epi-MgO films, respectively. Subsequently, the LaMnO3 cap layer and YBa2Cu3O7-x (YBCO) functional layer were deposited on the epi-MgO layer to test the quality of the MgO layer. Finally, the critical current density of the YBCO films was 6 MA/cm2 (77 K, 500 nm, self-field), indicating that this research provides a high-quality MgO substrate for the YBCO layer.

Preparation of Thick Bazro3 Epitaxial Film for Coated Conductors by Polymer-Assisted Chemical Solution Deposition Method

Growth of Thick La2Zr2O7 Buffer Layers for Coated Conductors by Polymer-Assisted Chemical Solution Deposition

Preparation of Gd2zr2o7 Buffer Layers for Coated Conductor by Polymer-Assisted Chemical Solution Deposition

Highly (001)-oriented zirconium-doped ceria films grown on biaxially textured nickel tungsten substrates through an inorganic-salts-based chemical solution deposition route

Improved Textured La2Zr2O7 Buffer Layers on Bi-Axially Textured Ni–W Substrates Using CeO2 Seed Layers for YBa2Cu3O7−x Coated Conductors

Metal Organic Deposition of Lanthanum Zirconate Buffer Layer on Biaxially Textured Ni-5%W Substrate

Reel-To-Reel Continuous Deposition Of Ce(X)Zr(1-X)O(2) Single Buffer Layer For Ybco Coated Conductors

Fabrication and Characterization of La2Zr2O7 Films on Different Buffer Architectures for YBa2Cu3O7−δ Coated Conductors by RF Magnetron Sputtering

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors

Polymer-assisted Chemical Solution Deposition of High-Quality La2Zr2O7 Buffer Layer Applied to Low-Cost YBCO-coated Conductors

Preparation of Biaxially Textured Ce1-x(Y0.2Zr0.8)xOδ Buffer Layers on RABiTS NiW Tapes by Chemical Solution Deposition

Preparation and Characterization of Ceo2/Ysz/Ceo2 Buffer Layers for Ybco Coated Conductors

Preparation of MgO Self-Epitaxial Films for YBCO High-Temperature Coated Conductors

Single Cerium Zirconate Buffer Layer on Biaxially Textured Metal Substrates for High Performance Coated Conductors

Simultaneous double-sided deposition of long-length epitaxial CeO 2 buffer layers for YBCO coated conductors

Fabrication of YBCO Coated Conductors on Biaxial Textured Metal Substrate by All-Sputtering

Polymer-assisted chemical solution deposition for the preparation of BaZrO 3 (BZO) buffer layer for coated conductors

MOCVD of Heavily-Doped 25 Mol.% Zr-Added (gd, Y)Ba2Cu3O7-δ Coated Conductors

MOCVD Preparation of YBCO Coated Conductors on CeO2/YSZ/Y2O3 Buffered RABiTS Substrate

Tailoring the Crystallographic Orientation of MOD-derived La2Zr2O7 Buffer Layers for Coated Conductors

Characterisation of YSZ Layers Deposited on Y2O3 Buffered Textured Tapes for Coated Conductors