Measurement of Voids in A-Si:H Film and Their Influence on Silicon Heterojunction Solar Cell

Wenzhu Liu,Liping Zhang,Renfang Cheng,Fanying Meng,Zhengxin Liu
DOI: https://doi.org/10.1109/pvsc.2016.7750229
2016-01-01
Abstract:Diameter (D) and number density (A voids ) of large voids in a-Si:H films are determined using an easy optical method. Electric measurements of heterostructures: a-Si:H/c-Si/a-Si:H find both D and A affect passivation of c-Si surfaces. Additionally, I-V measurements of silicon heterojunction (SHJ) solar cells reveal that porous a-Si:H can also achieve excellent SHJ solar cell with an efficiency of 22.8%.
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