Property Investigation of A-Si/c-si Hetero-Junction Structure

WANG Jian-qiang,GAO Hua,ZHANG Jian,ZHANG Song,LI Chen,YE Qing-hao,MENG Fan-ying
2011-01-01
Abstract:This paper investigated the influence of a-Si/c-Si band offset,amorphous silicon emitter doping concentration and interface defects density on interface property of a-Si/c-Si structure.Band offset in a-Si(N+)/c-Si(P) hetero-junction and a-Si emitter high level doping is very useful for the transformation of recombination mechanism from dangling bond to SRH(Shockly-Read-Hall).AFORS-HET simulation indicates that a-Si(N+) emitter doping level of over 1.5×1020 cm-3 on c-Si(P) is an indispensable condition for achieving high efficiency.Comparing with density of short circuit current,open circuit voltage of a-Si/c-Si structure cell is much more susceptible to interface defect density.
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