Effect of Alloy Scattering on Hole Mobility of Ssi/ssige/ssoi Quantum Well Pmosfets

W. Wu,W. Yu,Q. Zhao,J. Sun,D. Zhai,Y. Shi,Y. Zhao
DOI: https://doi.org/10.7567/ssdm.2013.d-3-4
2013-01-01
Abstract:School of Electronic Science and Engineering, Nanjing UniversityNanjing 210093, People's Republic of China * E-mail: yzhao@nju.edu.cn State Key Laboratory of Functional Materials for Informatics, Shanghai, 200050, People’s Republic of China Peter Grünberg Institute 9 (PGI 9-IT), Forschungszentrum Juelich, 52425 Juelich, Germany State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027, People's Republic of China
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