Investigation of Coulomb Scattering on Ssi/Si0.5ge0.5/Ssoi Quantum-Well P-Mosfets

Wen Jiao,Liu Qiang,Liu Chang,Wang Yize,Zhang Bo,Xue Zhongying,Di Zengfeng,Yu Wenjie,Zhao Qingtai
DOI: https://doi.org/10.1088/1674-4926/37/9/094002
2016-01-01
Journal of Semiconductors
Abstract:sSi/Si0.5Ge0.5/sSOI quantum-well (QW) p-MOSFETs with HfO2/TiN gate stack were fabricated and characterized. According to the low temperature experimental results, carrier mobility of the strained Si0.5Ge0.5 QW p-MOSFET was mainly governed by phonon scattering from 300 to 150 K and Coulomb scattering below 150 K, respectively. Coulomb scattering was intensified by the accumulated inversion charges in the Si cap layer of this Si/SiGe heterostructure, which led to a degradation of carrier mobility in the SiGe channel, especially at low temperature.
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