Impacts of Remote Coulomb Scattering on Hole Mobility in Si p-MOSFFETs at Cryogenic Temperatures

Xianle Zhang,Pengying Chang,Gang Du,Xiaoyan Liu
DOI: https://doi.org/10.23919/SNW.2019.8782899
2019-01-01
Abstract:In this work, impacts of remote Coulomb scattering on hole mobility in Si p-MOSFETs devices at cryogenic temperatures are investigated. The physical models including phonon, surface roughness (SR) and remote Coulomb scatterings (RCS) are verified by reproducing fairly well the experimental results for temperature ranging from 300 to 30K, which are reliably employed to predict the hole mobility down to liquid helium temperatures (4.2K). Simulation results reveal that as temperature decreases, the RCS due to Si/SiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> interfacial trap charges plays an important role in determining hole mobility. Dependence of hole mobility on interfacial trap density is further explored at 4.2K.
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