Hole Mobility in the Ultra-Thin-body Junctionless Germanium-on-insulator P-Channel Metal-Oxide-semiconductor Field-Effect Transistors

Yukun Li,Rui Zhang
DOI: https://doi.org/10.1063/1.5086890
IF: 4
2019-01-01
Applied Physics Letters
Abstract:Junctionless Germanium-on-insulator (GOI) p-channel metal-oxide-semiconductor field-effect transistors (MOSFETs) have been realized with an ultra-thin-body (UTB) channel of down to 6 nm. The hole mobility of 166 cm2/V s has been realized at an Ns value of 1013 cm−2 attributable to the reduction of carrier scattering by interface traps under a bulk transport behavior for the devices. The back bias dependence of the hole mobility in junctionless UTB GOI pMOSFETs was examined; it is found that the hole mobility in the devices is dominated by the surface roughness scattering at the MOS interface.
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