Assessment of hole mobility in strained InSb, GaSb and InGaSb based ultra-thin body pMOSFETs with different surface orientations

Pengying Chang,Xiaoyan Liu,Gang Du,Xing Zhang
DOI: https://doi.org/10.1109/IEDM.2014.7047007
2014-01-01
Abstract:This work presents a systematic assessment of hole mobility in InSb, GaSb and InGaSb based ultra-thin body (UTB) double-gate pMOSFETs employing a self-consistent method based on 8×8 k · p Schrödinger and Poisson equations and including important scattering mechanisms. Physical models are calibrated against experiments. The effect of body thickness, surface/channel orientation, biaxial and uniaxial strain, and heterostructure design on hole mobility in III-V materials has been systematically investigated in order to help in providing useful guidelines.
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