MEMS Dynamic Testing System and Data Processing

周明才,白金鹏,谢勇君,来五星,史铁林
DOI: https://doi.org/10.3321/j.issn:1002-1582.2004.04.023
2004-01-01
Optical Technique
Abstract:A MEMS dynamic testing system based on stroboscopic microscopic interferometry is introduced. The algorithm of data analyzing is developed. The in-plane motion is measured with accuracy of 1/50 pixel by a sub-pixel template matching algorithm based on cubic spline interpolation. The fringe patterns are transformed to a 3-dimensional surface topography by a branch cut phase-unwrapping algorithm.
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