Growth model of van der Waals epitaxy of films: A case of AlN films on multilayer graphene/SiC.

Yu Xu,Bing Cao,Zongyao Li,Demin Cai,Yumin Zhang,Guoqiang Ren,Jianfeng Wang,Lin Shi,Chinhua Wang,Ke Xu
DOI: https://doi.org/10.1021/acsami.7b14494
IF: 9.5
2017-01-01
ACS Applied Materials & Interfaces
Abstract:'Volmer-Weber' island nucleation and step-flow growth model are the classical processes of the conventional epitaxy of films. However, growth model of van der Waals epitaxy of films is still not very well-documented. Here, we present an example of vdWE of AlN films on multilayer graphene/SiC by hydride vapor phase epitaxy at high temperature of 1100 oC, and reveal the orientation relationship of AlN, MLG, and SiC as (0001)[1-100]AlN‖(0001)[1-100]MLG‖(0001)[11-20]SiC, which suggests that vdWE heterointerface is not an usual covalent bonding and no excessive strain during the growth process owing to the incommensurate in-plane lattices. Remarkably, zigzag cracks are formed due to the anisotropy of strain after the films cooling down to room temperature, indicating that the growth model of vdWE is different from the one of conventional epitaxy. It is a layer-by-layer epitaxy, and planar substrate without miscut angle should be essential for obtaining single crystalline films. Additionally, the films can be transferred to foreign substrates by direct mechanical exfoliation without any stressor layer. An ultraviolet photosensor device illustrates an example of III-nitride heterogeneous integration application. Our work demonstrates an excellence step towards vdWE of varieties of compounds films on 2D materials for the applications of transferrable heterogeneous integration in future.
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