Metal‐Ion‐Modified Black Phosphorus with Enhanced Stability and Transistor Performance

Zhinan Guo,Si Chen,Zhongzheng Wang,Zhenyu Yang,Fei Liu,Yanhua Xu,Jiahong Wang,Ya Yi,Han Zhang,Lei Liao,Paul K. Chu,Xue-Feng Yu
DOI: https://doi.org/10.1002/adma.201703811
IF: 29.4
2017-01-01
Advanced Materials
Abstract:Black phosphorus (BP), a burgeoning elemental 2D semiconductor, has aroused increasing scientific and technological interest, especially as a channel material in field-effect transistors (FETs). However, the intrinsic instability of BP causes practical concern and the transistor performance must also be improved. Here, the use of metal-ion modification to enhance both the stability and transistor performance of BP sheets is described. Ag+ spontaneously adsorbed on the BP surface via cation-π interactions passivates the lone-pair electrons of P thereby rendering BP more stable in air. Consequently, the Ag+ -modified BP FET shows greatly enhanced hole mobility from 796 to 1666 cm2 V-1 s-1 and ON/OFF ratio from 5.9 × 104 to 2.6 × 106 . The mechanisms pertaining to the enhanced stability and transistor performance are discussed and the strategy can be extended to other metal ions such as Fe3+ , Mg2+ , and Hg2+ . Such stable and high-performance BP transistors are crucial to electronic and optoelectronic devices. The stability and semiconducting properties of BP sheets can be enhanced tremendously by this novel strategy.
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