Low Temperature Cu-Cu Bonding Using Ag Nanostructure for 3d Integration

Ziyu Liu,Jian Cai,Qian Wang,Lin Tan,Yang Hun
DOI: https://doi.org/10.1149/2.0061510ssl
IF: 3
2015-01-01
Materials Letters
Abstract:A novel reliable low temperature short time Cu-Cu bonding method using Ag nanostructure for 3D integration was realized in the work. Ag nanostructure consisted of many nanoparticles (NP) were deposited by pulsed laser deposition on patterned Cu pads. Bonding process was completed at 250 degrees C for 5 mm followed by an annealing process at 250 degrees C for 25 min. Average shear strength of 14.4 MPa was reached and cracks occurred at bonded Ag interfaces, Ag/Cu interfaces and TiW/Al interfaces. According to cross-sectional interface inspection, continuous void-free bonded-Ag film was observed at the bonding interface, which was significantly beneficial to lowering electrical resistance. (C) 2015 The Electrochemical Society. All rights reserved.
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