High-Performance Poly-Si Vertical Nanowire Thin-Film Transistor and the Inverter Demonstration

Le T. T.,Yu H. Y.,Sun Y.,Singh N.,Zhou X.,Shen N.,Lo G. Q.,Kwong D. L.
DOI: https://doi.org/10.1109/LED.2011.2136315
IF: 4.8157
2011-01-01
IEEE Electron Device Letters
Abstract:In this letter, gate-all-around vertical nanowire (NW) polycrystalline silicon (poly-Si) thin-film transistors (TFTs) are demonstrated using a CMOS-compatible process. Both Nand P-TFT devices (with gate length down to 100 nm and a wire diameter of ~30 nm) exhibit good transistor performance, e.g., high Ion/Ioff ratio of >; 106, low subthreshold slope (SS ~ 100 mV/dec), and reasonable drain-induced...
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