Abstract:Crystalline silicon, including Czochralski silicon (Cz-Si) and multicrystalline silicon (mc-Si),is main material for photovoltaic (PV) industry. How to produce more productive and less expensive crystalline silicon materials is still a big challenge. As we know, the seed-assisted growth method can be used to fabricate cast-mono (CM-Si) silicon by directional solidification, which should combine the both advantages of Cz-Si and mc-Si. However, there remain some problems to be resolved in growing CM-Si silicon ingots, particularly the control of dislocations which are the major and most detrimental defects in CM-Si. They can act as precipitation sites for impurities and thus reduce the carrier lifetime in ingots. Unlike mc-Si ingots, once dislocations are generated in the bottom of CM-Si ingots, they will glide and propagate along the growth direction without hindrance due to the lack of grain boundaries. In this presentation, we review our recent work of how to control defects, specially dislocations, in CM-Si. We induce a grain boundary by adjusting the orientation of seeds which can suppress the generation of dislocations originated from the junction of seeds. We have investigated the effect of Σ5, Σ13a grain boundary relationship at seed junctions of <100>-oriented CM-Si on dislocations and solar cell performance. We also use <110>-oriented seeds to grow new orientation CM-Si ingots to control the generation and propagation of dislocations. The results show that by designing the orientation of seeds, the dislocation density can be decreased and the solar cell efficiency can be improved obviously.

Structure and Origin of Carrot Defects on 4H-SiC Homoepitaxial Layers

Characterization of V-shaped Defects in 4H-SiC Homoepitaxial Layers

Reduction of Morphological Defects in 4H-Sic Epitaxial Layers

Defect Revelation and Evaluation of 4h Silicon Carbide by Optimized Molten Koh Etching Method

Surface Defects in 4H-Sic: Properties, Characterizations and Passivation Schemes

Influence of Defects in SiC (0001) on Epitaxial Graphene

Characterization of Obtuse Triangular Defects on 4H-Sic 4° Off-Axis Epitaxial Wafers

Characterization and formation mechanism of short step-bunching defects on 4H-SiC thick homoepitaxial films

Study of a new type nominal “washboard-like” triangular defects in 4H-SiC 4° off-axis (0 0 0 1) Si-face homoepitaxial layers

Surface Defects and Accompanying Imperfections in 4h–sic: Optical, Structural and Electrical Characterization

Dislocation proliferation at the growth crystal/seed interface of physical vapor transport-grown 4H-SiC crystals

Distribution of Basal Plane Dislocations in 4-Degree Off-Axis 4H-Sic Single Crystals

Surface Defects Generated by Extrinsic Origins on 4H-Sic Epitaxial-Wafers Observed by Scanning Electron Microscopy

Identification of Dominant Scattering Mechanism in Epitaxial Graphene on Sic

Structure and electronic properties of closed-ring defects in epitaxial graphene

Anisotropic Deformation of 4H-Sic Wafers: Insights from Nanoindentation Tests

Growth of 4H-Sic Epilayers with Low Surface Roughness and Morphological Defects Density on 4° Off-Axis Substrates

Understanding the Breakdown Asymmetry of 4H-Sic Power Diodes with Extended Defects at Locations along Step-Flow Direction

(Invited) Defects in Cast-Mono Crystalline Silicon

Investigation on Step-Bunched Homoepitaxial Layers Grown on On-Axis 4H-SiC Substrates via Molten KOH Etching

Influence of Growth Process on Suppression of Surface Morphological Defects in 4H-SiC Homoepitaxial Layers