Identification of Dominant Scattering Mechanism in Epitaxial Graphene on Sic

Jingjing Lin,Liwei Guo,Yuping Jia,Rong Yang,Shuang Wu,Jiao Huang,Yu Guo,Zhilin Li,Guangyu Zhang,Xiaolong Chen
DOI: https://doi.org/10.1063/1.4875384
IF: 4
2014-01-01
Applied Physics Letters
Abstract:A scheme of identification of scattering mechanisms in epitaxial graphene (EG) on SiC substrate is developed and applied to three EG samples grown on SiC (0001), (112¯0), and (101¯0) substrates. Hall measurements combined with defect detection technique enable us to evaluate the individual contributions to the carrier scatterings by defects and by substrates. It is found that the dominant scatterings can be due to either substrate or defects, dependent on the substrate orientations. The EG on SiC (112¯0) exhibits a better control over the two major scattering mechanisms and achieves the highest mobility even with a high carrier concentration, promising for high performance graphene-based electronic devices. The method developed here will shed light on major aspects in governing carrier transport in EG to harness it effectively.
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