A Robust Lateral Shift Free (LSF) Electrothermal Micromirror with Flexible Multimorph Beams
Hengzhang Yang,Anrun Ren,Yingtao Ding,Lei Xiao,Teng Pan,Yangyang Yan,Wenlong Jiao,Huikai Xie
DOI: https://doi.org/10.1038/s41378-023-00570-8
2023-01-01
Microsystems & Nanoengineering
Abstract:Electrothermal bimorph-based scanning micromirrors typically employ standard silicon dioxide (SiO 2 ) as the electrothermal isolation material. However, due to the brittle nature of SiO 2 , such micromirrors may be incapable to survive even slight collisions, which greatly limits their application range. To improve the robustness of electrothermal micromirrors, a polymer material is incorporated and partially replaces SiO 2 as the electrothermal isolation and anchor material. In particular, photosensitive polyimide (PSPI) is used, which also simplifies the fabrication process. Here, PSPI-based electrothermal micromirrors have been designed, fabricated, and tested. The PSPI-type micromirrors achieved an optical scan angle of ±19.6° and a vertical displacement of 370 μm at only 4 Vdc. With a mirror aperture size of 1 mm × 1 mm, the PSPI-type micromirrors survived over 200 g accelerations from either vertical or lateral directions in impact experiments. In the drop test, the PSPI-type micromirrors survived falls to a hard floor from heights up to 21 cm. In the standard frequency sweeping vibration test, the PSPI-type micromirrors survived 21 g and 29 g acceleration in the vertical and lateral vibrations, respectively. In all these tests, the PSPI-type micromirrors demonstrated at least 4 times better robustness than SiO 2 -type micromirrors fabricated in the same batch.