Effect of the Grain Boundaries in Small Grain Polysilicon Thin Film Transistors

a sakri,a le glaunec,y colin,olivier bonnaud
DOI: https://doi.org/10.1007/978-3-642-93413-1_49
1989-01-01
Abstract:The characteristics of small grain polysilicon TFT’s are presented. The constancy of the leakage current (VGS < 0) and the weak variation of the breakdown voltage as a function of the gate voltage VGS are respectively explained by taking into account the role of:i) the first grain boundary parallel to the Si/SiO2 interface, ii) the first grain boundary parallel to the drain-substrate interface.
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