Spectromicroscopy of Tantalum Oxide Memristors

John Paul Strachan,Gilberto Medeiros-Ribeiro,J. Joshua Yang,M. -X. Zhang,Feng Miao,Ilan Goldfarb,Martin Holt,Volker Rose,R. Stanley Williams
DOI: https://doi.org/10.1063/1.3599589
IF: 4
2011-01-01
Applied Physics Letters
Abstract:We report experiments to measure material changes in tantalum oxide-based memristive devices. The high endurance and low power demonstrated in this material system suggests a unique mechanism for the switching, which we investigated using x-ray based spectromicroscopy and nanospectroscopy. Our study nondestructively identified a localized (<150nm diameter) Ta-rich phase surrounded by nano- or polycrystalline Ta2O5.
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