Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging (Adv. Electron. Mater. 1/2024)

Matthew Flynn‐Hepford,John Lasseter,Ivan Kravchenko,Steven Randolph,Jong Keum,Bobby G. Sumpter,Stephen Jesse,Petro Maksymovych,A. Alec Talin,Matthew J. Marinella,Philip D. Rack,Anton V. Ievlev,Olga S. Ovchinnikova
DOI: https://doi.org/10.1002/aelm.202470001
IF: 6.2
2024-01-11
Advanced Electronic Materials
Abstract:Memristive Mechanisms In article number 2300589, Olga S. Ovchinnikova and co‐workers image charge trapping and ionic motion with multimodal imaging techniques to elucidate the mechanisms that drive reversable resistive switching in amorphous Ta2O5/Ta/TiN films. In‐situ conductive‐AFM and secondary ion mass spectrometry are utilized, along with complementary ion beam irradiation, to visualize oxygen motion within the active layers.
materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
What problem does this paper attempt to address?