Non-destructive imaging of bulk electrical 'hidden' state switching in a 1T-TaS2 cryo-memory device

Corinna Burri,Nelson Hua,Dario Ferreira Sanchez,Wenxiang Hu,Henry G. Bell,Rok Venturini,Shih-Wen Huang,Aidan G. McConnell,Faris Dizdarevic,Anze Mraz,Damjan Svetin,Benjamin Lipovsek,Marko Topic,Dimitrios Kazazis,Gabriel Aeppli,Daniel Grolimund,Yasin Ekinci,Dragan Mihailovic,Simon Gerber
2024-11-08
Abstract:In transition metal dichalcogenides a plethora of emergent states arise from competing electron-electron and electron-phonon interactions. Among these, the non-volatile metallic 'hidden' state of 1T-TaS2 can be induced from its insulating equilibrium charge-density wave ground state using either optical or electrical pulses. Here we report in-operando micro-beam X-ray diffraction, fluorescence, and concurrent transport measurements, allowing us to spatially image the non-thermal hidden state induced by electrical switching of a 1T-TaS2 device. Our findings reveal that the electrically and optically switched hidden states are structurally equivalent. Additionally, we observe a bulk switching channel extending beyond the intergap space to partially underneath the electrodes, suggesting that the non-equilibrium phase is caused by a combination of charge flow and lattice response. Besides identifying strain propagation as an important factor for non-thermal switching of layered materials, our results illustrate the power of non-destructive, three-dimensional X-ray imaging for studying phase-change materials and devices.
Strongly Correlated Electrons
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