Carrier recombination dynamics in green InGaN-LEDs with quantum-dot-like structures
Ming Tian,Cangmin Ma,Tao Lin,Jianping Liu,Devki N. Talwar,Hui Yang,Jiehua Cao,Xinying Huang,Wenlong Niu,Ian T. Ferguson,Lingyu Wan,Zhe Chuan Feng
DOI: https://doi.org/10.1007/s10853-020-05343-6
IF: 4.5
2020-09-29
Journal of Materials Science
Abstract:Exciton localization phenomena are considered here to comprehend the high internal quantum efficiency in InGaN/GaN multiple-quantum-well structures having discrete quantum dots (QDs) prepared by metal–organic-chemical-vapor deposition method on <i>c</i>-sapphire substrates. Spectroscopic results from the variable-temperature steady-state-photoluminescence and time-resolved photoluminescence (TRPL) are investigated. While the exciton localization is enhanced by strong localized states within the InGaN/GaN QDs–the impact of free carrier recombination cannot be ignored. The observed non-exponential decay in TRPL measurements is explained using a model by meticulously including localized exciton, non-radiative and free carrier recombination rates. A new method is proposed to calculate the internal quantum efficiency, which is supplementary to the traditional approach based on temperature-dependent photoluminescence measurement.
materials science, multidisciplinary