On-wafer Characterization of In0.52Al0.48As/In0.53Ga0.47As Modulation-Doped Field-Effect Transistor with 4.2 Ps Switching Time and 3.2 Ps Delay

A ZENG,MK JACKSON,M VANHOVE,W DERAEDT
DOI: https://doi.org/10.1063/1.114687
IF: 4
1995-01-01
Applied Physics Letters
Abstract:We report fabrication and electro-optic measurement of In0.52Al0.48As/In0.53Ga0.47As modulation- doped field-effect transistors. The devices are monolithically integrated with coplanar stripline fixtures incorporating photoconductive switches. The switching time for a 0.35 μm T-gate device is 4.2 ps and the delay is 3.2 ps. This is the fastest directly measured switching in a three-terminal device reported to date.
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