Improved Carrier Injection in Gate-All-around Schottky Barrier Silicon Nanowire Field-Effect Transistors

J. W. Peng,S. J. Lee,G. C. Albert Liang,N. Singh,S. Y. Zhu,G. Q. Lo,D. L. Kwong
DOI: https://doi.org/10.1063/1.2973211
IF: 4
2008-01-01
Applied Physics Letters
Abstract:This letter presents the performance improvement of Schottky barrier metal-oxide-semiconductor field-effect transistor by employing gate-all-around (GAA) Si-nanowire (SiNW) structure. Without employing any barrier lowering technique, the mid-band-gap Ni-silicide Schottky barrier transistors demonstrated excellent performance and achieved subthreshold slope of ∼86 mV/decade and on-current of 19 μA/μm on a 12.5 nm SiNW, and subthreshold slope of ∼79 mV/decade and on-current of 207 μA/μm on a 4 nm diameter SiNW. Assisted with simulation, we show that this improvement can be attributed to the strong reduction in the Schottky barrier thickness as a result of the better gate control of GAA SiNW structure.
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