Influence of the Heterojunction on the Field Emission from Tetrahedral Amorphous Carbon on Si

NL Rupesinghe,M Chhowalla,GAJ Amaratunga,P Weightman,D Martin,P Unsworth,J Murray
DOI: https://doi.org/10.1063/1.1310623
IF: 4
2000-01-01
Applied Physics Letters
Abstract:In order to study the influence of the back barrier on the electron emission properties of tetrahedral amorphous carbon (ta-C), we have deposited identical films on p and n+ Si. The valence and conduction band offsets were measured for ta-C on p and n+ Si using in situ x-ray photoelectron spectroscopy and optical spectroscopy. From the band measurements it is shown that there is a substantial back barrier to emission. We show that for films having very similar properties, the electron emission can be influenced by the ta-C/Si heterojunction.
What problem does this paper attempt to address?