Photoluminescence Spectroscopy Of Nearly Defect-Free Inn Microcrystals Exhibiting Nondegenerate Semiconductor Behaviors

chinglien hsiao,hsucheng hsu,lichyong chen,chienting wu,chunwei chen,min chen,liwei tu,kueihsien chen
DOI: https://doi.org/10.1063/1.2804568
IF: 4
2007-01-01
Applied Physics Letters
Abstract:Nearly defect-free InN microcrystals grown on Si(111) substrates have been realized by plasma-assisted molecular beam epitaxy. High-resolution transmission electron microscope images reveal that these microcrystals exhibit single-crystalline wurtzite structure. Low temperature photoluminescence (PL) shows a strong emission peak at 0.679 eV with a very narrow linewidth of 17 meV at excitation power density of 3.4 W/cm(2). Temperature-dependent PL spectra follow the Varshni equation well, and peak energy blueshifts by similar to 45 meV from 300 to 15 K. Power-density-dependent PL spectroscopy manifests direct near-band-edge transition. A low carrier density of 3 x 10(17) cm(-3) has been estimated from PL empirical relation, which is close to the critical carrier density of the Mott transition of 2 x 10(17) cm(-3). (C) 2007 American Institute of Physics.
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