Wide-Dynamic-Range Zero-Bias Microwave Detector Using AlGaN/GaN Heterojunction Field-Effect Diode

Qi Zhou,King-Yuen Wong,Wanjun Chen,Kevin J. Chen
DOI: https://doi.org/10.1109/lmwc.2010.2045591
IF: 3
2010-01-01
IEEE Microwave and Wireless Components Letters
Abstract:An AlGaN/GaN HEMT-compatible lateral field-effect diode has been used for zero-bias microwave detector application. Using the versatile fluorine plasma ion treatment technique, we have been able to realize a diode that exhibits strong nonlinearity near zero bias, thus, eliminating DC supplies in microwave detector circuits. The AlGaN/GaN microwave detectors deliver high sensitivity, wide dynamic range and high temperature operating capability. The maximum zero-bias curvature coefficient (gamma) measured are 11.6 V-1 and 3.2 V-1 at 50 degrees C and 250 degrees C, respectively, yielding a directly-measured sensitivity (beta(v)) of 1027 mV/mW at 50 degrees C and 466 mV/mW at 250 degrees C. The peak conjugately-matched sensitivity (beta(v,opt)) is projected to be 9030 mV/mW at 2 GHz at 50 degrees C. At room temperature, the wide dynamic range of 53 and 54 dB at 2 and 5 GHz are observed, respectively, both of which are the highest values reported so far.
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