Structural and Magnetic Properties of Fe2crsi Heusler Alloy and Tunneling Magneto Resistance of Its Magnetic Tunneling Junctions

Yu-Pu Wang,Jin-Jun Qiu,Hui Lu,Qi-Jia Yap,Wen-Hong Wang,Gu-Chang Han,Duc-The Ngo,Kie-Leong Teo
DOI: https://doi.org/10.1109/inec.2013.6466002
2013-01-01
Abstract:We report the magnetic properties, microstructure and surface morphology of epitaxially grown Fe2CrSi films. Highly ordered B2 films were obtained by deposition at room temperature followed by annealing at 400°C. Magnetic tunnel junctions using Fe2CrSi show a tunnelling magnetoresistance (TMR) of 2.5%. The low TMR is ascribed to the oxidation of Fe2CrSi at the interface with MgO. An enhancement of TMR to 8.1% was achieved by inserting a 0.3nm Mg between Fe2CrSi and MgO to prevent the oxidation of Fe2CrSi.
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