Fabrication of Silicon-Silicide-On-Insulator Substrates Using Wafer Bonding and Layer-Cutting Techniques

SY Zhu,GP Ru,YP Huang
DOI: https://doi.org/10.1109/icsict.2001.981568
2001-01-01
Abstract:A novel single-crystalline Si/poly-CoSi/sub 2//SiO/sub 2//Sub-Si structure has been successfully formed by silicon wafer bonding and hydrogen implantation induced layer cutting techniques. The hydrogen implanted silicon wafer were deposited by a thin Co and Si films subsequently and was brought into contact with an. During the oxidized silicon wafer at room temperature. During the subsequent annealing, the hydrogen-implanted wafer was split along the projected range, leaving a thin Si film and the above deposited films on the oxidized wafer to form a multi-layer structure. The following annealing procedure not only increases the bond strength, but also employs solid state reaction of the deposited Co to form a buried poly-crystalline CoSi/sub 2/ layer with a resistivity of about 160 /spl mu//spl Omega//spl middot/cm.
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