Buried Cobalt Silicide Layer Under Thin Silicon Film Fabricated By Wafer Bonding And Hydrogen-Induced Delamination Techniques

shiyang zhu,yiping huang,guoping ru,xinping qu,bingzong li
DOI: https://doi.org/10.1149/1.1391997
IF: 3.9
1999-01-01
Journal of The Electrochemical Society
Abstract:A buried poly-CoSi2 layer under a thin monocrystalline Si film has been successfully fabricated using wafer bonding and hydrogen-induced delamination techniques. A Co and Si deposited wafer was brought into contact with a hydrogen-implanted wafer at room temperature. During annealing in N-2 ambient, the hydrogen-implanted wafer was split at the projected range of the implanted proton, remaining a thin monocrystalline Si layer bonded to the other wafer, and the buried CoSi2 layer was also formed through solid-phase reaction. The electrical properties of the Si/CoSi2/Si structure after different rapid thermal anneal treatments were studied by spreading resistance probe and current voltage measurements. (C) 1999 The Electrochemical Society. All rights reserved.
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