Fast Step-Down Set Algorithm of Resistive Switching Memory with Low Programming Energy and Significant Reliability Improvement

Y. Meng,X. Y. Xue,Y. L. Song,J. G. Yang,B. A. Chen,Y. Y. Lin,Q. T. Zou,R. Huang,J. G. Wu
DOI: https://doi.org/10.1109/vlsit.2014.6894435
2014-01-01
Abstract:We propose an asymmetric write algorithm of step-down set/step-up reset without verify for the first time. The demonstration is carried out on a 128Kb test macro of AlOx/WOx bi-layer ReRAM fabricated based on 0.18μm logic process. The set and reset energy per bit are reduced by 34% and 20% respectively. The set and reset access time decrease by 54% and 32% respectively. The mean value of endurance distribution is improved by 2 orders of magnitude from 107 to 109. Ron and Roff retention failure rate is reduced by 88% and 71% respectively. Roff/Ron window enlarges from 25× to 180×. The reliability improvements are attributed to refinement of CF shape and size by the step-down set algorithm.
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