Influence of the Deposition Parameters on the Microstructure and Mechanical Properties of B-doped nc-Si: H Films
Jianning Ding,Hongshan Qi,Ningyi Yuan,Yuliang He,Guanggui Cheng,Zhen Fan,Haibin Pan,Junxiong Wang,Xiuqin Wang
DOI: https://doi.org/10.13922/j.cnki.cjovst.2009.02.011
2009-01-01
Abstract:The boron-doped hydrogenatd nanocrystalline silicon (nc-Si:H) films were grown by plasma enhanced chemical vapor deposition (PECVD). The microstructures and mechanical properties of the films were characterized with Raman spectroscopy, atomic force microscopy (AFM) and conventional mechanical probes. The influence of various film growth conditions, including the substrate temperature, RF power, and annealing temperature, on its microstructures and mechanical properties was studied. The results show that the films growth conditions strongly affect the microstructures of the films. For instance, as the substrate temperature rises up, the average grain size increases; annealing significantly roughens the surfaces of the B-doped and the control samples, and improves the mechanical properties of the B-doped films. We found that the deposition rate can be optimized at a certain RF power. Possible film growth mechanisms were tentatively discussed.