Influence of Boron Doping on Microcrystalline Silicon Growth

Li Xin-Li,Chen Yong-Sheng,Yang Shi-E,Gu Jin-Hua,Lu Jing-Xiao,Gao Xiao-Yong,Li Rui,Jiao Yue-Chao,Gao Hai-Bo,Wang Guo
DOI: https://doi.org/10.1088/1674-1056/20/9/096801
2011-01-01
Chinese Physics B
Abstract:Microcrystalline silicon (μc-Si:H) thin films with and without boron doping are deposited using the radio-frequency plasma-enhanced chemical vapour deposition method.The surface roughness evolutions of the silicon thin films are investigated using ex situ spectroscopic ellipsometry and an atomic force microscope.It is shown that the growth exponent β and the roughness exponent α are about 0.369 and 0.95 for the undoped thin film,respectively.Whereas,for the boron-doped μc-Si:H thin film,β increases to 0.534 and α decreases to 0.46 due to the shadowing effect.
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