Growth and Characterization of Boron-Doped na-Si:H Films Used as Window Layer Material of Solar Cells

Zhe Li,Xiwen Zhang,Gaorong Han
DOI: https://doi.org/10.13922/j.cnki.cjovst.2009.02.002
2009-01-01
Abstract:The boron-doped, nano-amorphous silicon (na-Si:H) films were deposited by plasma enhanced chemical vapor deposition (PECVD) to fabricate the window layers of solar cells. The microstructures and optical properties of the na-Si:H films were characterized by X-ray diffraction (XRD), Raman spectrometre and UV-VI spectophotometer. The influence of film growth conditions, including the gas flow ratios of B2H6/SiH4, RF power, the flow rate of the doping gas, and the substrate temperature, on the microstructures and properties of the film was studied. The results show that the boron content significantly affects the grain size and crystalline volume fraction of the na-Si:H films. For example, light boron doping favors crystallization of the na-Si:H. As boron dopant contents increases, the catalyst poisoning of boron results in amorphous phase. The B-doped na-Si:H has a larger optical band gap (Eopt=1.99eV), higher conductivity and lower activation energy of conductivity than the p-type a-Si:H films. We suggest that the B-doped na-Si:H be a good window layer material of thin film solar-cells.
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