Rectifying the Current-Voltage Characteristics of A Linbo3 Film/Gan Heterojunction

Hao Lan-Zhong,Liu Yun-Jie,Zhu Jun,Lei Hua-Wei,Liu Ying-Ying,Tang Zheng-Yu,Zhang Ying,Zhang Wan-Li,Li Yan-Rong
DOI: https://doi.org/10.1088/0256-307x/28/10/107703
2011-01-01
Chinese Physics Letters
Abstract:Epitaxial LiNbO3 (LNO) films are grown on n-type GaN semiconductor substrates, forming LNO/GaN p-n junctions. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of the junctions are studied. The I-V curve shows a clear rectifying property with a turn-on voltage of 2.4 V. For the forward voltages, the conduction mechanism transits from Schottky thermionic emission for low voltages to space-charge-limited current for large voltages. Reverse C-V characteristics exhibit a linear 1/C-2 versus V plot, from which a built-in potential of 0.34 V is deduced. These results are explained using the energy-band structure of the LNO/GaN junction.
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