Electronic Structure of Gainn Semiconductors Investigated by X-Ray Absorption Spectroscopy

Q. X. Guo,H. Senda,K. Saito,T. Tanaka,M. Nishio,J. Ding,T. X. Fan,D. Zhang,X. Q. Wang,S. T. Liu,B. Shen,R. Ohtani
DOI: https://doi.org/10.1063/1.3583461
IF: 4
2011-01-01
Applied Physics Letters
Abstract:We have investigated the electronic structure of GaInN semiconductors by performing x-ray absorption near-edge fine structure (XANES) spectroscopy at Ga K-edge and self-consistent-field real-space multiple-scattering theory calculations. It was demonstrated that the nondestructive Ga K-edge XANES spectra can be used as the fingerprints of structure and composition for GaInN. The theoretical calculations gave a reasonable reproduction of the experimental spectral features. The results revealed that the combination of the experimental XANES and the theoretical calculations is a powerful tool for studying the electronic structure of GaInN semiconductors.
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