Dependence Of Mg Acceptor Levels In Inn On Doping Density And Temperature

Masayuki Fujiwara,Yoshihiro Ishitani,Xinqiang Wang,Kazuhide Kusakabe,Akihiko Yoshikawa
DOI: https://doi.org/10.1063/1.3656990
IF: 2.877
2011-01-01
Journal of Applied Physics
Abstract:Infrared (IR) reflectance and transmission spectra of Mg doped InN films are analyzed using a dielectric function consisting of the terms of phonon, plasmon, and electronic transition between the valence band and the acceptor levels. The reflectance spectra at lower temperatures than 200K are highly affected by the electronic transition. Acceptor activation energy E(a) decreases with the increase in ionized acceptors because of the Coulomb potential overlap of acceptors charged by the background electrons and/or hole generation by the temperature increase. It is found that E(a) is 69(+/- 5) meV at low Mg(-) density limit and decreases to 50 meV at 5K because of the charging by the background electrons of the density of 1 x 10(18) cm(-3). Temperature increase causes the further decrease in E(a), which causes the high hole density of the order of 10(18) cm(-3) at room temperature in spite of the high degeneracy of the acceptor states. The heavy hole mass is obtained as 0.59(+/- 0.06)m(0). (C) 2011 American Institute of Physics. [doi:10.1063/1.3656990]
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