Influence of Indium Doping on Acceptor Activation Energy in P-Type Al_xGa_(1-x)N

张延召,秦志新,桑立雯,许正昱,于涛,杨子文,沈波,张国义,赵岚,张向锋,成彩晶,孙维国
2010-01-01
Abstract:Influence of Indium doping on acceptor activation energy in p-type AlxGa1-xN was presented.The p-type AlxGa1-xN epilayers were grown on AlN/sapphire templates by metal organic chemical vapor deposition (MOCVD).TMIn flow rate is varied as 0,40,80 and 120 sccm while keeping other growth conditions changeless.X-ray diffraction (XRD) was used to determine the crystalline quality and Al composition in AlxGa1-xN epilayers.At room temperature,the resistivity of p-type Al0.43Ga0.57N epilayer grown In doping is in order of 104 Ω·cm,but that grown without In is above 1 × 106 Ω·cm.Variable temperature Hall-effect measurements were employed to determine the acceptor activation energy in p-type Al0.43Ga0.57N epilayers.It was seen that the acceptor activation energy decreases significantly with the introduction of In.The minimum of 259 meV is obtained at TMIn flow rate of 80 sccm.It was suggested that acceptor-donor-acceptor (A-D-A) complexes could be formed in p-type Al0.43 Ga0.57 N epilayers.The formation of A-D-A complexes would decrease the acceptor activation energy in p-type Al0.43Ga0.57N epilayers due to lower activation energy for AD-A complexes.In order to verify the influence of the In-ambient on acceptor activation energy,the ultraviolet light-emitting diodes (UV-LEDs) were fabricated.It was seen that there are a lower turn-on voltage and a lower diode series resistance for the UV-LEDs fabricated with p-type Al0.43 Ga0.57 N grown under In-doping,compared with that without In-ambient.
What problem does this paper attempt to address?