Silicon Doping Dependence of n-Type Al0.5Ga0.5 N Layers Grown by Metalorganic Chemical Vapor Deposition.

L LIANG,Z RONG,X ZILI,Z YU,X XIANGQIAN,L BIN,Z JIANJUN,C LIN,Y HUIQIANG,H PING
DOI: https://doi.org/10.1016/S1002-0721(07)60502-X
IF: 4.632
2008-01-01
Journal of Rare Earths
Abstract:The electrical, structure and optical properties of Si-doped Al0.5Ga0.5N epilayers with a thickness of about 0.5 μ grown on sapphire substrates using an AIN buffer by metalorganic chemical vapor deposition were reported. Hall-effect measurements showed that n-type Al0.5Ga0.5N was achieved achieved with an electron concentration of 1.2 × 1019 cm−3 and mobility of 12 cm2·Vs−1 at room temperature. The electron concentration increases with an increase of Si doping level. Lattice constant of c and Raman shift of Si-doped Al0.5Ga0.5N epilayers with various SiH4 flow rates was studied by X-ray diffraction (XRD) and Raman scattering spectrum. With increasing SiH4 flow rate, the decrease of the lattice constant of c and the frequency of E2 phonon implies gradual relaxation of the stress in the epilayers.
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