Abstract:The modern FPGAs have begun to use 6-input look-up tables to perform configurable logic,such as Xilinx's Virtex-5 series,Ultrascale series and so on.Due to the limited number of IOB ports,most approaches choose the ILA based method for the functional test of these chips' CLB module,and use read-back techniques for fault isolation.Unfortunately some of the data-paths are exclusive in CLB;So ILA methods usually cost more configurations,while read-back is quite slow.The Built-In Self-Test(BIST) methods directorially check the output pins of CLBs,which reduce the number of configurations.But BIST methods should transfer test benches signals to ever BUT,which leads to massive fan-out and make it difficult to route the design.This paper presents a new BIST method which use the free resource in ORAs to form latch chains to transfer test benches.This method is able to decrease the fan-out of I/O ports.And the remaining logic resources are configured to form a scan-chain for faster fault isolation.The BIST method is tested on a Xilinx 7 series FPGA chips.Compared with the former works,the number of configurations is reduced from 30 to 26,and the cost of fault isolation is reduced to 61.35 ns with a 2.4 MHz clock.

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Bist Approach for Testing Embedded Memory Blocks in System-On-Chips

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An Improvement Test Approach of Look-up Table in SRAM-Based FPGAs

Build-in Self-Test Design of Embedded SRAM for TFT-LCD Driver IC

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Hybrid BIST for system-on-a-chip using an embedded FPGA core

Improved Method for Combinational Circuit's Built-In Self Test

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

A register-transfer level BIST partitioning approach for ASIC designs

An All-Digital Built-In Self-Test for Charge-Pump Phase-Locked Loops